diff options
author | Gael Guennebaud <g.gael@free.fr> | 2018-07-17 14:46:15 +0200 |
---|---|---|
committer | Gael Guennebaud <g.gael@free.fr> | 2018-07-17 14:46:15 +0200 |
commit | 82f0ce27261df3b21037d93d4595655b3df754a6 (patch) | |
tree | aa62ebfceb605052be0cc3c4456852dfecef7fda /unsupported/test/cxx11_tensor_padding_sycl.cpp | |
parent | 37f4bdd97df454f2c85c6047d190f5db21c3a09b (diff) |
Get rid of EIGEN_TEST_FUNC, unit tests must now be declared with EIGEN_DECLARE_TEST(mytest) { /* code */ }.
This provide several advantages:
- more flexibility in designing unit tests
- unit tests can be glued to speed up compilation
- unit tests are compiled with same predefined macros, which is a requirement for zapcc
Diffstat (limited to 'unsupported/test/cxx11_tensor_padding_sycl.cpp')
-rw-r--r-- | unsupported/test/cxx11_tensor_padding_sycl.cpp | 4 |
1 files changed, 2 insertions, 2 deletions
diff --git a/unsupported/test/cxx11_tensor_padding_sycl.cpp b/unsupported/test/cxx11_tensor_padding_sycl.cpp index dc748b73e..727a9ffd7 100644 --- a/unsupported/test/cxx11_tensor_padding_sycl.cpp +++ b/unsupported/test/cxx11_tensor_padding_sycl.cpp @@ -15,7 +15,7 @@ #define EIGEN_TEST_NO_LONGDOUBLE #define EIGEN_TEST_NO_COMPLEX -#define EIGEN_TEST_FUNC cxx11_tensor_padding_sycl + #define EIGEN_DEFAULT_DENSE_INDEX_TYPE int64_t #define EIGEN_USE_SYCL @@ -149,7 +149,7 @@ template<typename DataType, typename dev_Selector> void sycl_padding_test_per_de test_padded_expr<DataType, ColMajor, int64_t>(sycl_device); } -void test_cxx11_tensor_padding_sycl() +EIGEN_DECLARE_TEST(cxx11_tensor_padding_sycl) { for (const auto& device :Eigen::get_sycl_supported_devices()) { CALL_SUBTEST(sycl_padding_test_per_device<float>(device)); |