From 82f0ce27261df3b21037d93d4595655b3df754a6 Mon Sep 17 00:00:00 2001
From: Gael Guennebaud <g.gael@free.fr>
Date: Tue, 17 Jul 2018 14:46:15 +0200
Subject: Get rid of EIGEN_TEST_FUNC, unit tests must now be declared with
 EIGEN_DECLARE_TEST(mytest) { /* code */ }. This provide several advantages: -
 more flexibility in designing unit tests - unit tests can be glued to speed
 up compilation - unit tests are compiled with same predefined macros, which
 is a requirement for zapcc

---
 unsupported/test/cxx11_tensor_padding_sycl.cpp | 4 ++--
 1 file changed, 2 insertions(+), 2 deletions(-)

(limited to 'unsupported/test/cxx11_tensor_padding_sycl.cpp')

diff --git a/unsupported/test/cxx11_tensor_padding_sycl.cpp b/unsupported/test/cxx11_tensor_padding_sycl.cpp
index dc748b73e..727a9ffd7 100644
--- a/unsupported/test/cxx11_tensor_padding_sycl.cpp
+++ b/unsupported/test/cxx11_tensor_padding_sycl.cpp
@@ -15,7 +15,7 @@
 
 #define EIGEN_TEST_NO_LONGDOUBLE
 #define EIGEN_TEST_NO_COMPLEX
-#define EIGEN_TEST_FUNC cxx11_tensor_padding_sycl
+
 #define EIGEN_DEFAULT_DENSE_INDEX_TYPE int64_t
 #define EIGEN_USE_SYCL
 
@@ -149,7 +149,7 @@ template<typename DataType, typename dev_Selector> void sycl_padding_test_per_de
   test_padded_expr<DataType, ColMajor, int64_t>(sycl_device);
 
 }
-void test_cxx11_tensor_padding_sycl()
+EIGEN_DECLARE_TEST(cxx11_tensor_padding_sycl)
 {
   for (const auto& device :Eigen::get_sycl_supported_devices()) {
     CALL_SUBTEST(sycl_padding_test_per_device<float>(device));
-- 
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