Get rid of EIGEN_TEST_FUNC, unit tests must now be declared with EIGEN_DECLARE_TEST(mytest) { /* code */ }.

This provide several advantages:
- more flexibility in designing unit tests
- unit tests can be glued to speed up compilation
- unit tests are compiled with same predefined macros, which is a requirement for zapcc

1 files changed, 2 insertions, 2 deletions

diff --git a/unsupported/test/cxx11_tensor_generator_sycl.cpp b/unsupported/test/cxx11_tensor_generator_sycl.cpp
index f551c8d0c..fb6e3d9d0 100644
--- a/unsupported/test/cxx11_tensor_generator_sycl.cpp
+++ b/unsupported/test/cxx11_tensor_generator_sycl.cpp
@@ -13,7 +13,7 @@
 
 #define EIGEN_TEST_NO_LONGDOUBLE
 #define EIGEN_TEST_NO_COMPLEX
-#define EIGEN_TEST_FUNC cxx11_tensor_generator_sycl
+
 #define EIGEN_DEFAULT_DENSE_INDEX_TYPE int64_t
 #define EIGEN_USE_SYCL
 static const float error_threshold =1e-8f;
@@ -139,7 +139,7 @@ template<typename DataType, typename dev_Selector> void sycl_generator_test_per_
   test_gaussian_sycl<DataType, RowMajor, int64_t>(sycl_device);
   test_gaussian_sycl<DataType, ColMajor, int64_t>(sycl_device);
 }
-void test_cxx11_tensor_generator_sycl()
+EIGEN_DECLARE_TEST(cxx11_tensor_generator_sycl)
 {
   for (const auto& device :Eigen::get_sycl_supported_devices()) {
     CALL_SUBTEST(sycl_generator_test_per_device<float>(device));