From 82f0ce27261df3b21037d93d4595655b3df754a6 Mon Sep 17 00:00:00 2001 From: Gael Guennebaud Date: Tue, 17 Jul 2018 14:46:15 +0200 Subject: Get rid of EIGEN_TEST_FUNC, unit tests must now be declared with EIGEN_DECLARE_TEST(mytest) { /* code */ }. This provide several advantages: - more flexibility in designing unit tests - unit tests can be glued to speed up compilation - unit tests are compiled with same predefined macros, which is a requirement for zapcc --- unsupported/test/cxx11_tensor_image_patch_sycl.cpp | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) (limited to 'unsupported/test/cxx11_tensor_image_patch_sycl.cpp') diff --git a/unsupported/test/cxx11_tensor_image_patch_sycl.cpp b/unsupported/test/cxx11_tensor_image_patch_sycl.cpp index eea18ec70..c1828a0ec 100644 --- a/unsupported/test/cxx11_tensor_image_patch_sycl.cpp +++ b/unsupported/test/cxx11_tensor_image_patch_sycl.cpp @@ -13,7 +13,7 @@ #define EIGEN_TEST_NO_LONGDOUBLE #define EIGEN_TEST_NO_COMPLEX -#define EIGEN_TEST_FUNC cxx11_tensor_image_patch_sycl + #define EIGEN_DEFAULT_DENSE_INDEX_TYPE int64_t #define EIGEN_USE_SYCL @@ -1084,7 +1084,7 @@ test_patch_padding_same_sycl(sycl_device); test_patch_no_extra_dim_sycl(sycl_device); test_imagenet_patches_sycl(sycl_device); } -void test_cxx11_tensor_image_patch_sycl() +EIGEN_DECLARE_TEST(cxx11_tensor_image_patch_sycl) { for (const auto& device :Eigen::get_sycl_supported_devices()) { CALL_SUBTEST(sycl_tensor_image_patch_test_per_device(device)); -- cgit v1.2.3